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"Simultaneous Layout Migration and Decomposition for Double Patterning ..."

Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif (2011)

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DOI: 10.1109/TCAD.2010.2079990

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif:
Simultaneous Layout Migration and Decomposition for Double Patterning Technology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(2): 284-294 (2011)

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