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"Automatic test pattern generation for functional register-transferlevel ..."

Indradeep Ghosh, Masahiro Fujita (2001)

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DOI: 10.1109/43.913758

access: closed

type: Journal Article

metadata version: 2020-10-26

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Indradeep Ghosh, Masahiro Fujita:
Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(3): 402-415 (2001)

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