"A Sub-Threshold Noise Transient Simulator Based on Integrated Random ..."

Marco Donato et al. (2018)

> Home

Details and statistics

DOI: 10.1109/TCAD.2017.2717705

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/DonatoBPZ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/DonatoBPZ18
Marco Donato, R. Iris Bahar, William R. Patterson, Alexander Zaslavsky:
A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(3): 643-656 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.