"Circuit-level electrothermal simulation of electrical overstress failures ..."

Carlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury (1994)

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DOI: 10.1109/43.275358

access: closed

type: Journal Article

metadata version: 2020-09-24

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Carlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury:
Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(4): 482-493 (1994)

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