"Parametric yield formulation of MOS IC's affected by mismatch effect."

Massimo Conti et al. (1999)

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DOI: 10.1109/43.759074

access: closed

type: Journal Article

metadata version: 2020-09-24

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Massimo Conti, Paolo Crippa, Simone Orcioni, Claudio Turchetti:
Parametric yield formulation of MOS IC's affected by mismatch effect. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(5): 582-596 (1999)

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