"Methodology for electromigration critical threshold design rule evaluation."

J. Joseph Clement et al. (1999)

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DOI: 10.1109/43.759073

access: closed

type: Journal Article

metadata version: 2020-09-24

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J. Joseph Clement, Stefan P. Riege, Radenko Cvijetic, Carl V. Thompson:
Methodology for electromigration critical threshold design rule evaluation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(5): 576-581 (1999)

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