"Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug."

Yun Cheng et al. (2019)

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DOI: 10.1109/TCAD.2018.2818690

access: closed

type: Journal Article

metadata version: 2023-05-11

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Yun Cheng, Huawei Li, Ying Wang, Xiaowei Li:
Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(4): 767-779 (2019)

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