Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Fast Semi-Analytic Approach for Combined Electromigration and ..."

Liang Chen et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TCAD.2020.2994271

access: closed

type: Journal Article

metadata version: 2023-12-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/ChenTSPTM21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/ChenTSPTM21
Liang Chen, Sheldon X.-D. Tan, Zeyu Sun, Shaoyi Peng, Min Tang, Junfa Mao:
A Fast Semi-Analytic Approach for Combined Electromigration and Thermomigration Analysis for General Multisegment Interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(2): 350-363 (2021)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.