"A complement-based fast algorithm to generate universal test sets for ..."

Beyin Chen, Chung-Len Lee (1994)

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DOI: 10.1109/43.265678

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type: Journal Article

metadata version: 2023-03-07

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Beyin Chen, Chung-Len Lee:
A complement-based fast algorithm to generate universal test sets for multi-output functions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(3): 370-377 (1994)

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