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"Linear Time Electromigration Analysis Based on Physics-Informed Sparse ..."

Liang Chen et al. (2023)

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DOI: 10.1109/TCAD.2023.3269393

access: closed

type: Journal Article

metadata version: 2023-12-19

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Liang Chen, Wentian Jin, Mohammadamir Kavousi, Subed Lamichhane, Sheldon X.-D. Tan:
Linear Time Electromigration Analysis Based on Physics-Informed Sparse Regression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4126-4138 (2023)

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