BibTeX record journals/tcad/ChangL95

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@article{DBLP:journals/tcad/ChangL95,
  author    = {Jau{-}Shien Chang and
               Chen{-}Shang Lin},
  title     = {Test set compaction for combinational circuits},
  journal   = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume    = {14},
  number    = {11},
  pages     = {1370--1378},
  year      = {1995},
  url       = {https://doi.org/10.1109/43.469663},
  doi       = {10.1109/43.469663},
  timestamp = {Thu, 24 Sep 2020 11:29:06 +0200},
  biburl    = {https://dblp.org/rec/journals/tcad/ChangL95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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