"Redundancy removal and test generation for circuits with non-Boolean ..."

Srimat T. Chakradhar, Steven G. Rothweiler, Vishwani D. Agrawal (1997)

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DOI: 10.1109/43.663826

access: closed

type: Journal Article

metadata version: 2020-09-24

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Srimat T. Chakradhar, Steven G. Rothweiler, Vishwani D. Agrawal:
Redundancy removal and test generation for circuits with non-Boolean primitives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(11): 1370-1377 (1997)

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