"Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using ..."

Sounil Biswas, Ronald D. Blanton (2011)

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DOI: 10.1109/TCAD.2010.2066630

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sounil Biswas, Ronald D. Blanton:
Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(1): 148-158 (2011)

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