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"Experimental Characterization of CMOS Interconnect Open Defects."
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras (2008)
- Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(1): 123-136 (2008)
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