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"Combinational ATPG theorems for identifying untestable faults in ..."

Vishwani D. Agrawal, Srimat T. Chakradhar (1995)

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DOI: 10.1109/43.406717

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/AgrawalC95
Vishwani D. Agrawal, Srimat T. Chakradhar:
Combinational ATPG theorems for identifying untestable faults in sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(9): 1155-1160 (1995)

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