"Optimal Design and Sequential Analysis of VLSI Testing Strategy."

Philip S. Yu, C. Mani Krishna, Yann-Hang Lee (1988)

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DOI: 10.1109/12.2171

access: closed

type: Journal Article

metadata version: 2022-09-10

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Philip S. Yu, C. Mani Krishna, Yann-Hang Lee:
Optimal Design and Sequential Analysis of VLSI Testing Strategy. IEEE Trans. Computers 37(3): 339-347 (1988)

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