"BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical ..."

Jie Xiao et al. (2022)

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DOI: 10.1109/TC.2021.3071253

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type: Journal Article

metadata version: 2024-02-05

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Jie Xiao, Zhanhui Shi, Xuhua Yang, Jungang Lou:
BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Trans. Computers 71(5): 1063-1076 (2022)

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