"Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and ..."

Dong Xiang et al. (2007)

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DOI: 10.1109/TC.2007.1002

access: closed

type: Journal Article

metadata version: 2022-06-13

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Dong Xiang, Kaiwei Li, Jiaguang Sun, Hideo Fujiwara:
Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction. IEEE Trans. Computers 56(4): 557-562 (2007)

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