"Testability Analysis and Scalable Test Generation for High-Speed ..."

George Xenoulis et al. (2006)

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DOI: 10.1109/TC.2006.187

access: closed

type: Journal Article

metadata version: 2020-10-26

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George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis:
Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units. IEEE Trans. Computers 55(11): 1449-1457 (2006)

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