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"Simulation-Based Functional Test Generation for Embedded Processors."

Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng (2006)

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DOI: 10.1109/TC.2006.186

access: closed

type: Journal Article

metadata version: 2022-12-07

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  dblp key:
  - journals/tc/WenWC06
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  persistent URL:
  - https://dblp.org/rec/journals/tc/WenWC06
Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng:
Simulation-Based Functional Test Generation for Embedded Processors. IEEE Trans. Computers 55(11): 1335-1343 (2006)

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