"On the Effect of Defect Clustering on Test Transparency and IC Test ..."

Adit D. Singh, C. Mani Krishna (1996)

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DOI: 10.1109/12.506431

access: closed

type: Journal Article

metadata version: 2022-09-10

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Adit D. Singh, C. Mani Krishna:
On the Effect of Defect Clustering on Test Transparency and IC Test Optimization. IEEE Trans. Computers 45(6): 753-757 (1996)

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