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"Functional Fault Simulation as a Guide for Biased-Random Test Pattern ..."

Gabriel M. Silberman, Ilan Y. Spillinger (1991)

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DOI: 10.1109/12.67321

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/SilbermanS91
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  persistent URL:
  - https://dblp.org/rec/journals/tc/SilbermanS91
Gabriel M. Silberman, Ilan Y. Spillinger:
Functional Fault Simulation as a Guide for Biased-Random Test Pattern Generation. IEEE Trans. Computers 40(1): 66-79 (1991)

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