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"A Reliability-Critical Path Identifying Method With Local and Global ..."

Zhanhui Shi et al. (2024)

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DOI: 10.1109/TC.2023.3323772

access: closed

type: Journal Article

metadata version: 2024-01-13

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Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang:
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. IEEE Trans. Computers 73(1): 123-137 (2024)

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