"Test Pattern Generation for API Faults in RAM."

Kewal K. Saluja, Kozo Kinoshita (1985)

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DOI: 10.1109/TC.1985.1676572

access: closed

type: Journal Article

metadata version: 2017-05-20

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Kewal K. Saluja, Kozo Kinoshita:
Test Pattern Generation for API Faults in RAM. IEEE Trans. Computers 34(3): 284-287 (1985)

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