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"Multiple Scan Chains for Power Minimization during Test Application in ..."

Nicola Nicolici, Bashir M. Al-Hashimi (2002)

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DOI: 10.1109/TC.2002.1009155

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/NicoliciA02
Nicola Nicolici, Bashir M. Al-Hashimi:
Multiple Scan Chains for Power Minimization during Test Application in Sequential Circuits. IEEE Trans. Computers 51(6): 721-734 (2002)

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