"Test-Experiments for Detection and Location of Intermittent Faults in ..."

Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya (1981)

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DOI: 10.1109/TC.1981.1675743

access: closed

type: Journal Article

metadata version: 2017-05-20

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Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya:
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981)

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