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"Using Low Cost Erasure and Error Correction Schemes to Improve Reliability ..."

Hsing Min Chen et al. (2016)

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DOI: 10.1109/TC.2016.2550455

access: closed

type: Journal Article

metadata version: 2018-07-31

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  - journals/tc/ChenJABWMC16
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  persistent URL:
  - https://dblp.org/rec/journals/tc/ChenJABWMC16
Hsing Min Chen, Supreet Jeloka, Akhil Arunkumar, David T. Blaauw, Carole-Jean Wu, Trevor N. Mudge, Chaitali Chakrabarti:
Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems. IEEE Trans. Computers 65(12): 3766-3779 (2016)

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