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"Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography ..."

Sun Young Jang et al. (2017)

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DOI: 10.1109/TBME.2016.2552496

access: closed

type: Journal Article

metadata version: 2023-09-30

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Sun Young Jang, Ho Kyung Kim, Hanbean Youn, Seungryong Cho, Ian A. Cunningham:
Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners. IEEE Trans. Biomed. Eng. 64(1): 173-183 (2017)

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