"Patterns of technology life cycles: stochastic analysis based on patent ..."

Changyong Lee et al. (2017)

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DOI: 10.1080/09537325.2016.1194974

access: closed

type: Journal Article

metadata version: 2022-10-02

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Changyong Lee, Juram Kim, Meansun Noh, Han-Gyun Woo, KwangWook Gang:
Patterns of technology life cycles: stochastic analysis based on patent citations. Technol. Anal. Strateg. Manag. 29(1) (2017)

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