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"Joint weakly and fully supervised learning for surface defect segmentation ..."

Bin Hu, Xinggang Wang, Wenyong Yu (2022)

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DOI: 10.1016/J.IMAGE.2022.116807

access: closed

type: Journal Article

metadata version: 2022-08-25

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Bin Hu, Xinggang Wang, Wenyong Yu:
Joint weakly and fully supervised learning for surface defect segmentation from images. Signal Process. Image Commun. 107: 116807 (2022)

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