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"MeaSSUre:I-V: Open software for transistor characterization using ..."

Hongseok Oh, Hyunsoo Kim, Hyerin Jo (2023)

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DOI: 10.1016/J.SOFTX.2023.101318

access: open

type: Journal Article

metadata version: 2023-08-28

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Hongseok Oh, Hyunsoo Kim, Hyerin Jo:
MeaSSUre:I-V: Open software for transistor characterization using source-meter units. SoftwareX 21: 101318 (2023)

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