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"Layered and Real-Valued Negative Selection Algorithm for Fault Detection."

Anam Abid, Muhammad Tahir Khan, Clarence W. de Silva (2018)

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DOI: 10.1109/JSYST.2017.2753851

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/sj/AbidKS18
Anam Abid, Muhammad Tahir Khan, Clarence W. de Silva:
Layered and Real-Valued Negative Selection Algorithm for Fault Detection. IEEE Syst. J. 12(3): 2960-2969 (2018)

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