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"Source Consistency Electrical Impedance Tomography."

Tingting Zhang et al. (2020)

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DOI: 10.1137/18M1225264

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/siamam/ZhangJOJWW20
Tingting Zhang, Geuk Young Jang, Tong In Oh, Kyung Woon Jeung, Hun Wi, Eung Je Woo:
Source Consistency Electrical Impedance Tomography. SIAM J. Appl. Math. 80(1): 499-520 (2020)

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