"Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced ..."

Weifu Fang, Kazufumi Ito (1994)

> Home

Details and statistics

DOI: 10.1137/S0036139992234804

access: closed

type: Journal Article

metadata version: 2020-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/siamam/FangI94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/siamam/FangI94
Weifu Fang, Kazufumi Ito:
Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced Current Image. SIAM J. Appl. Math. 54(4): 1067-1082 (1994)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.