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"Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology ..."
Lian Xue et al. (2020)
- Lian Xue, Hongxin Luo, Qianshun Diao, Fugui Yang
, Jie Wang, Zhongliang Li:
Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique. Sensors 20(22): 6660 (2020)
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