"RAIM and Failure Mode Slope: Effects of Increased Number of Measurements ..."

Jean-Bernard Uwineza, Jay A. Farrell (2023)

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DOI: 10.3390/S23104947

access: open

type: Journal Article

metadata version: 2023-07-07

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Jean-Bernard Uwineza, Jay A. Farrell:
RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults. Sensors 23(10): 4947 (2023)

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