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ORCID"Deep Quality Assessment of a Solar Reflector Based on Synthetic Data: ..."
Alexios Papacharalampopoulos et al. (2020)
- Alexios Papacharalampopoulos
, Konstantinos Tzimanis, Kyriakos Sabatakakis, Panagiotis Stavropoulos:
Deep Quality Assessment of a Solar Reflector Based on Synthetic Data: Detecting Surficial Defects from Manufacturing and Use Phase. Sensors 20(19): 5481 (2020)
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