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"Resolution Enhanced Array ECT Probe for Small Defects Inspection."

Cai Long et al. (2023)

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DOI: 10.3390/S23042070

access: open

type: Journal Article

metadata version: 2023-04-16

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Cai Long, Na Zhang, Xinchen Tao, Yu Tao, Chaofeng Ye:
Resolution Enhanced Array ECT Probe for Small Defects Inspection. Sensors 23(4): 2070 (2023)

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