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"N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared ..."
Chun-Hsien Liu, Sheng-Di Lin (2023)
- Chun-Hsien Liu, Sheng-Di Lin:
N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors. Sensors 23(23): 9586 (2023)
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