"Severity Estimation for Interturn Short-Circuit and Demagnetization Faults ..."

Hojin Lee et al. (2022)

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DOI: 10.3390/S22124639

access: open

type: Journal Article

metadata version: 2024-03-08

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Hojin Lee, Hyeyun Jeong, Seongyun Kim, Sang Woo Kim:
Severity Estimation for Interturn Short-Circuit and Demagnetization Faults through Self-Attention Network. Sensors 22(12): 4639 (2022)

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