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"Evaluation of Apple Maturity with Two Types of Dielectric Probes."
Marcin Kafarski et al. (2018)
- Marcin Kafarski, Andrzej Wilczek, Agnieszka Szyplowska, Arkadiusz Lewandowski, Piotr Mariusz Pieczywek, Grzegorz Janik, Wojciech Skierucha:
Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors 18(1): 121 (2018)
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