"Sensing and Reliability Improvement of Electrostatic-Discharge Transient ..."

Shen-Li Chen, Yi-Cih Wu (2018)

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DOI: 10.3390/S18103340

access: open

type: Journal Article

metadata version: 2020-05-30

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Shen-Li Chen, Yi-Cih Wu:
Sensing and Reliability Improvement of Electrostatic-Discharge Transient by Discrete Engineering for High-Voltage 60-V n-Channel Lateral-Diffused MOSFETs with Embedded Silicon-Controlled Rectifiers. Sensors 18(10): 3340 (2018)

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