Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Dependability evaluation of integrated circuits at design time against ..."

Huiyun Li, Hai Yuan (2012)

> Home

Details and statistics

DOI: 10.1002/SEC.327

access: closed

type: Journal Article

metadata version: 2020-09-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/scn/LiY12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/scn/LiY12
Huiyun Li, Hai Yuan:
Dependability evaluation of integrated circuits at design time against laser fault injection. Secur. Commun. Networks 5(5): 450-461 (2012)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.