"I_DDQ test vector selection for transistor short fault testing."

Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita (1997)

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DOI: 10.1002/(SICI)1520-684X(199705)28:5<11::AID-SCJ2>3.0.CO;2-R

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type: Journal Article

metadata version: 2023-09-13

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Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita:
I_DDQ test vector selection for transistor short fault testing. Syst. Comput. Jpn. 28(5): 11-21 (1997)

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