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"Method of pattern positioning for automatic verification of seal imprint."

Katsuhiko Ueda, Yoshikazu Nakamura (1987)

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DOI: 10.1002/SCJ.4690180102

access: closed

type: Journal Article

metadata version: 2023-09-13

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  - https://dblp.org/rec/journals/scjapan/UedaN87
Katsuhiko Ueda, Yoshikazu Nakamura:
Method of pattern positioning for automatic verification of seal imprint. Syst. Comput. Jpn. 18(1): 13-22 (1987)

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