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"Precise detection of short-circuit defects on TFT substrate by infrared ..."

Shunji Maeda et al. (1999)

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DOI: 10.1002/(SICI)1520-684X(19991115)30:12<72::AID-SCJ8>3.0.CO;2-P

access: closed

type: Journal Article

metadata version: 2023-09-13

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Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani:
Precise detection of short-circuit defects on TFT substrate by infrared image matching. Syst. Comput. Jpn. 30(12): 72-84 (1999)

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