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ORCID"A test circuit for pin shorts generating oscillation in CMOS logic circuits."
Masahiro Ichimiya et al. (2004)
- Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
A test circuit for pin shorts generating oscillation in CMOS logic circuits. Syst. Comput. Jpn. 35(13): 10-20 (2004)
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