"Static test compaction for IDDQ testing of bridging faults in sequential ..."

Yoshinobu Higami et al. (2000)

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DOI: 10.1002/1520-684X(200010)31:11<41::AID-SCJ5>3.0.CO;2-F

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type: Journal Article

metadata version: 2023-09-13

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Yoshinobu Higami, Kewal K. Saluja, Yuzo Takamatsu, Kozo Kinoshita:
Static test compaction for IDDQ testing of bridging faults in sequential circuits. Syst. Comput. Jpn. 31(11): 41-50 (2000)

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