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"Automatic line-shaped defect evaluation of solid-state imaging device."

Toshio Asano et al. (1990)

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DOI: 10.1002/SCJ.4690211008

access: closed

type: Journal Article

metadata version: 2023-09-13

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  - journals/scjapan/AsanoHKS90
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  - https://dblp.org/rec/journals/scjapan/AsanoHKS90
Toshio Asano, Seiji Hata, Susumu Koishikawa, Youichi Shimizu:
Automatic line-shaped defect evaluation of solid-state imaging device. Syst. Comput. Jpn. 21(10): 78-88 (1990)

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