"Experience effects of patent examiners: an empirical study of the career ..."

Tetsuo Wada (2024)

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DOI: 10.1007/S11192-024-05037-9

access: closed

type: Journal Article

metadata version: 2024-12-22

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Tetsuo Wada:
Experience effects of patent examiners: an empirical study of the career length and citation patterns on triadic patents. Scientometrics 129(10): 6333-6348 (2024)

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